Téléchargez le livre : CMOS RF Circuit Design for Reliability and Variability

CMOS RF Circuit Design for Reliability and Variability

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Paru le : 2016-04-13

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...
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Description du livre

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

À propos

Auteur
Jiann-Shiun Yuan
Éditeur
Springer
Collection
SpringerBriefs in Applied Sciences and Technology
Parution
2016-04-13
Pages
106 pages
EAN papier
9789811008825

Auteur(s) du livre


Defaut-Illustration Jiann-Shiun Yuan

Caractéristiques détaillées - droits

EAN EPUB
9789811008849
Prix
52,74 €
Nombre pages copiables
1
Nombre pages imprimables
10
Taille du fichier
2437 Ko
Ce livre est accessible aux handicaps informations d'accessibilité

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